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dc.contributor.authorMalyutina-Bronskaya, V.V.-
dc.contributor.authorSemchenko, A.V.-
dc.contributor.authorSidsky, V.V.-
dc.contributor.authorFedorov, V.E.-
dc.contributor.authorСемченко, А.В.-
dc.contributor.authorСидский, В.В.-
dc.date.accessioned2022-02-18T12:05:23Z-
dc.date.available2022-02-18T12:05:23Z-
dc.date.issued2017-
dc.identifier.citationProperties of ZnO:Er3+ Films Obtained by the Sol–Gel Method / V.V. Malyutina-Bronskaya [et al.] // Semiconductors. - 2017. - Vol. 51, No. 3. - P. 392–395.ru
dc.identifier.urihttp://elib.gsu.by/jspui/handle/123456789/33674-
dc.description.abstractPolycrystalline and single-phase ZnO:Al:Er3+ films are synthesized by the sol–gel method (based on different types of solvents) on surfaces of single-crystal silicon and glass. The electrical measurement data (current–voltage and capacitance–voltage characteristics) show that these ZnO:Al:Er3+ films are photosensitive. The introduction of Er3+ rare-earth ions into a zinc-oxide film manifests itself in photosensitivity of the current–voltage and capacitance–voltage characteristics to light in the visible and infrared (IR) spectral ranges. The results of this study indicate that ZnO:Al:Er3+ films synthesized by the sol–gel method can be used to design optoelectronic devices, in particular, to form solar-cell active layers.ru
dc.language.isoРусскийru
dc.titleProperties of ZnO:Er3+ Films Obtained by the Sol–Gel Methodru
dc.typeArticleru
dc.rootSemiconductorsru
dc.number№ 3ru
dc.volume51ru
dc.identifier.DOI10.1134/S1063782617030186ru
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